Phi nano tof ii

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Webb4 dec. 2024 · 飞行时间二次离子质谱仪，PHI nano TOF II，*套，单价****万元；服务要求见招标文件六、其它补充事宜中标供应商和落标供应商请在本中标公告发出后联系我公司分别领取中标通知书和落标通知书，同时办理退还保证金等事宜。招标代理服务费开户银行及帐 … Webb飞行时间二次离子质谱仪 / PHI nano TOF 3/TOF-SIMS 报价面议查看同类产品型号 TOF-SIMS 产地日本样本下载品牌 ULVAC-PHI 核心参数仪器种类飞行时间原始束流或速能 …

飛行時間二次離子質譜儀

Webb1 okt. 2024 · ToF-SIMS measurements were conducted with a PHI nano ToF II (ULVAC-PHI Inc., Japan). Bi 3++ beam (30 kV) was used as the primary beam to detect the samples. The unbunched mode (UB mode) was also employed … WebbTime-of-flight secondary-ion mass spectrometry (TOF-SIMS) provides sub-micrometer elemental, chemical, and molecular characterization and imaging of solid surfaces. … northampton general hospital portal

PHI TOF-SIMS 用户成果赏析-北京理工大学先进材料实验中心

WebbTOF-SIMS Depth profile: Depth profiling measurement was conducted on a Time-of-Flight Second Ion Mass Spectrometry instrument (TOF-SIMS, PHI nano TOF II, Physical … Webb31 mars 2024 · The sputtering beam raster area given in the Table 2 was selected by performing the sputtering at different locations on the sample with the variation of the … WebbPHI nanoTOF II飞行时间二次离子质谱仪. tel: 400-6699-117 转 1000. 爱发科二次离子质谱/离子探针, 特点：立体收集角度大和深景深二次离子以不同的初始能量和角度从样品表 … northampton general hospital radiotherapy

TOF-SIMS Parallel Imaging MS/MS - Covalent Metrology Analytical …

http://www.phi-nano.com/%D9%85%D9%86%D8%AD-%D8%AF%D8%B1%D8%A7%D8%B3%D9%8A%D8%A9/ Webb3. PHI nanoTOF II TOF-SIMS instrument (Physical Electronics, Minnesota, U.S.A.) equipped with a 30 kV Bi n q+ cluster liquid metal ion gun (LMIG), a precursor selection device, a collision cell, and a parallel linear time-of-flight tube suitable to perform tandem mass spectrometry. 1.2.3 The nanoTOF MS/MS instrument is controlled by SmartSoft northampton general hospital respiratoryWebbimaging the distribution of both elements and molecules on the surface of materials. TOF-SIMS is the only mass spectrometry imaging technique that provides less than 70 nm spatial resolution with full mass range detection. The PHI nanoTOF II Parallel Imaging MS/MS platform has established itself as uniquely capable of providing superior analytical northampton general hospital radiology number

"Webb6 nov. 2024 · PHI nanoTOF II飞行时间二次离子质谱仪是超灵敏的表面分析技术，可检测表面分子成分和分布，元素及其同位素。所有元素和同位素，包括氢都可以用飞行时间二 … " - Phi nano tof ii

Phi nano tof ii

Multi-dimensional characterizations of washing durable …

WebbPHI nanoTOF3は、高質量分解能モードで500 nm、高空間分解能モードで50 nmの高い空間分解能でのTOF-SIMS分析を提供します。高輝度イオン源、高精度パルス機構、高分 … WebbULVAC-PHI 飞行时间型二次离子质谱仪PHI nano TOF II TRIFT 系列. 三次聚焦分析仪适用于平面，不平整以及表面形貌复杂的样品，多种溅射离子枪实现三维成像的深度分 …

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Webb1 jan. 2024 · 2.4. Characterizations. m was evaluated by NBS Smoke Density Chamber following ASTM E662-2009 procedure. The particle sizes of MDH were measured via laser particle size analyzer (Mastersizer 3000). Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) mapping measurements were conducted with a PHI nano ToF II. Webbphi nanotof iitm是第五代sims仪器，该仪器具有独特的专利飞行时间（tof）分析仪，它拥有市场上tof-sims仪器中最大的角度和能量接收范围，它使用了具有优良离子传输能力的 …

Webbdepth is 242.5 nm as shown in Figure 1(ii) and total sputtering duration is 820 s. ToF-SIMS data acquisition To measure the secondary ion counts, the PHI nano ToF II TRIFT was used from Physical Electronics, MN, USA. In this process, a 10 ns pulsed liquid metal ion gun (LMIG) uses Gallium (Ga+) sources to produce ions as primary ion Webbwwwphicom 1 PHI nanoTOF II TOF-SIMS wwwphicom 2 25+ Years of TOF-SIMS at PHI PHI has a long history of developments to support new applications 1507 08 09 10 11 1204 ...

Webb4 dec. 2024 · 飞行时间二次离子质谱仪，PHI nano TOF II，1套，单价1389万元；服务要求见招标文件六、其它补充事宜中标供应商和落标供应商请在本中标公告发出后联系我公 … Webb26 nov. 2024 · ToF-SIMS measurements were conducted with a PHI nano ToF II (ULVAC- PHI Inc., Chigasaki, Kanagawa, Japan), where a 30 kV Bi+pulsed primary ion beam was …

WebbPHI nanoTOF II™ SIMS 分析・計測機器表面分析装置 nanoTOF II は、イオン透過特性に優れたトリプルフォーカス静電アナライザ（TRIFT型アナライザ）を継承しつつ、新し …

WebbULVAC-PHI, Japan “Precise Mass Analysis of Organic Materials by PHI Nano-TOF II Equipped with Tandem MS/MS” Dr. Hossein Sepehri-Amin: NIMS, Japan “UV Laser … northampton general hospital radiology depthttp://www.shyue.idv.tw/sims%20notes.pdf northampton general hospital postcodeWebbULVAC-PHI 飞行时间型二次离子质谱仪PHI nano TOF II TRIFT 系列 . 三次聚焦分析仪适用于平面，不平整以及表面形貌复杂的样品，多种溅射离子枪实现三维成像的深度分 … how to repair scratched carWebbA TOF-SIMS instrument optimized for the highest sensitivity elemental and molecular analysis. PHI’s patented Parallel Imaging MS/MS mass spectrometer provides superior sensitivity, low spectral background, unique ability to image highly topographic surfaces, high mass accuracy and mass resolution, and unambiguous peak identification with … northampton general hospital radiologyWebbDescription. PHI’s patented TRIFT mass spectrometer provides superior sensitivity, low spectral background, and the unique ability to image highly topographic surfaces. The … northampton general hospital parking chargesWebbA conventional TOF-SIMS instrument (PHI nanoTOF II, ULVAC-PHI, Inc., Japan) was used in this study. In addition to the Bi and Ar-gas cluster ion columns used for OLED depth profiling, the instrument was also equipped with tandem MS (MS/MS) [2, 3]. A single nominal mass can be selected from the stream of northampton general hospital switchboardWebb飞行时间二次离子质谱仪（TOF-SIMS）设备型号： PHI nano TOF Ⅱ. 技术参数： 1)低质量时质量分辨率：m/z = 28 (Si+)和29 (SiH+) 的m/∆m ≥ 12,000. 2)高质量时质量分辨 … northampton general hospital plan